Please note: This is a beta version of the new dblp website.
You can find the classic dblp view of this page here.
You can find the classic dblp view of this page here.
Reinoud F. Wolffenbuttel
2000 – 2009
- 2008
[j14]Luis Alexandre Rocha, Lukas Mol, Edmond Cretu, Reinoud F. Wolffenbuttel, José Machado da Silva: A Pull-in Based Test Mechanism for Device Diagnostic and Process Characterization. VLSI Design 2008 (2008)- 2006
[j13]Ger de Graaf, Reinoud F. Wolffenbuttel: Systematic Approach for the Linearization and Readout of Nonsymmetric Impedance Bridges. IEEE T. Instrumentation and Measurement 55(5): 1566-1572 (2006)- 2005
[j12]Seong-Ho Kong, Reinoud F. Wolffenbuttel: Spectral performance of a micromachined infrared spectrum analyzer in silicon. IEEE T. Instrumentation and Measurement 54(1): 264-267 (2005)
[j11]Luis Alexandre Rocha, Edmond Cretu, Reinoud F. Wolffenbuttel: MEMS-based mechanical spectrum analyzer. IEEE T. Instrumentation and Measurement 54(3): 1260-1265 (2005)- 2004
[j10]Reinoud F. Wolffenbuttel: State-of-the-art in integrated optical microspectrometers. IEEE T. Instrumentation and Measurement 53(1): 197-202 (2004)
[j9]Ger de Graaf, Reinoud F. Wolffenbuttel: Illumination source identification using a CMOS optical microsystem. IEEE T. Instrumentation and Measurement 53(2): 238-242 (2004)- 2003
[j8]Luis Alexandre Rocha, Edmond Cretu, Reinoud F. Wolffenbuttel: Stability of a micromechanical pull-in voltage reference. IEEE T. Instrumentation and Measurement 52(2): 457-460 (2003)
[j7]Davey D. L. Wijngaards, Reinoud F. Wolffenbuttel: Study on temperature stability improvement of on-chip reference elements using integrated Peltier coolers. IEEE T. Instrumentation and Measurement 52(2): 478-482 (2003)- 2001
[j6]Reinoud F. Wolffenbuttel, Cees J. van Mullem: Guest editorial. IEEE T. Instrumentation and Measurement 50(6): 1467-1468 (2001)
[j5]Reinoud F. Wolffenbuttel, Cees J. van Mullem: The relationship between microsystem technology and metrology. IEEE T. Instrumentation and Measurement 50(6): 1469-1474 (2001)
[j4]Davey D. L. Wijngaards, Reinoud F. Wolffenbuttel: IC fabrication-compatible processing for instrumentation and measurement applications. IEEE T. Instrumentation and Measurement 50(6): 1475-1484 (2001)
[j3]Edmond Cretu, Luis Alexandre Rocha, Reinoud F. Wolffenbuttel: Micromechanical voltage reference using the pull-in of a beam. IEEE T. Instrumentation and Measurement 50(6): 1504-1507 (2001)
[j2]Ger de Graaf, Marian Bartek, Zhixiong Xiao, Cees J. van Mullem, Reinoud F. Wolffenbuttel: Bulk micromachined electrostatic RMS-to-DC converter. IEEE T. Instrumentation and Measurement 50(6): 1508-1512 (2001)
[j1]José Higino Correia, Ger de Graaf, Marian Bartek, Reinoud F. Wolffenbuttel: A CMOS optical microspectrometer with light-to-frequency converter, bus interface, and stray-light compensation. IEEE T. Instrumentation and Measurement 50(6): 1530-1537 (2001)
1990 – 1999
- 1995
[c1]Reinoud F. Wolffenbuttel, Ger de Graaf, E. Engen: Bipolar Circuits for Readout of an Integrated Silicon Color Sensor. ISCAS 1995: 299-302
Coauthor Index
data released under the ODC-BY 1.0 license. See also our legal information page
last updated on 2012-12-02 21:18 CET by the dblp team



