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Richard Wong
Rick Wong
2010 – today
- 2013
[c7]Michael J. Wirthlin, Joshua E. Jensen, Alex Wilson, William Howes, Shi-Jie Wen, Rick Wong: Placement of repair circuits for in-field FPGA repair. FPGA 2013: 115-124- 2012
- [j5]Yi Ren, L. Fan, Li Chen, Shi-Jie Wen, Richard Wong, N. W. van Vonno, Arthur F. Witulski, Bharat L. Bhuva: Single-Event Effects Analysis of a Pulse Width Modulator IC in a DC/DC Converter. J. Electronic Testing 28(6): 877-883 (2012)
- [j4]David Rennie, David Li, Manoj Sachdev, Bharat L. Bhuva, Srikanth Jagannathan, Shi-Jie Wen, Richard Wong: Performance, Metastability, and Soft-Error Robustness Trade-offs for Flip-Flops in 40 nm CMOS. IEEE Trans. on Circuits and Systems 59-I(8): 1626-1634 (2012)
- [c6]Ju-Yueh Lee, Cheng-Ru Chang, Naifeng Jing, Juexiao Su, Shi-Jie Wen, Rick Wong, Lei He: Heterogeneous configuration memory scrubbing for soft error mitigation in FPGAs. FPT 2012: 23-28
- 2011
- [j3]Jian Liu, Xin Wang, Hui Zhao, Qiang Fang, Albert Z. Wang, Lin Lin, He Tang, Siqiang Fan, Bin Zhao, Shi-Jie Wen, Richard Wong: Design and Analysis of Low-Voltage Low-Parasitic ESD Protection for RF ICs in CMOS. J. Solid-State Circuits 46(5): 1100-1110 (2011)
- [j2]Juan Antonio Maestro, Pedro Reviriego, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong: Mitigating the effects of large multiple cell upsets (MCUs) in memories. ACM Trans. Design Autom. Electr. Syst. 16(4): 45 (2011)
- [c5]David Rennie, David Li, Manoj Sachdev, Bharat L. Bhuva, Srikanth Jagannathan, Shi-Jie Wen, Rick Wong: Performance, metastability and soft-error robustness tradeoffs for flip-flops in 40nm CMOS. CICC 2011: 1-4
- [c4]Massoud Mokhtarpour Ghahroodi, Mark Zwolinski, Rick Wong, Shi-Jie Wen: Timing Vulnerability Factors of Ultra Deep-sub-micron CMOS. European Test Symposium 2011: 202
- [c3]Naifeng Jing, Ju-Yueh Lee, Zhe Feng, Weifeng He, Zhigang Mao, Shi-Jie Wen, Rick Wong, Lei He: Quantitative SEU Fault Evaluation for SRAM-Based FPGA Architectures and Synthesis Algorithms. FPL 2011: 282-285
- [c2]Changmin Jung, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong: Design method of NOR-type comparison circuit in CAM with ground bounce noise considerations. ISQED 2011: 390-397
- 2010
- [j1]Sanghyeon Baeg, Shi-Jie Wen, Richard Wong: Minimizing Soft Errors in TCAM Devices: A Probabilistic Approach to Determining Scrubbing Intervals. IEEE Trans. on Circuits and Systems 57-I(4): 814-822 (2010)
2000 – 2009
- 2008
- [c1]Damien Leroy, Rémi Gaillard, Erwin Schäfer, Cyrille Beltrando, Shi-Jie Wen, Richard Wong: Variation of SRAM Alpha-Induced Soft Error Rate with Technology Node. IOLTS 2008: 253-257
Coauthor Index
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last updated on 2013-04-25 21:49 CEST by the dblp team