Hirotake Yamamori

Hirotake Yamamori, Takahiro Yamada, Hitoshi Sasaki, Satoshi Kohjiro: NbN-Based Overdamped Josephson Junctions for Quantum Voltage Standards. IEICE Transactions 95-C(3): 329-336 (2012)

Ilya Budovsky, Dimitrios Georgakopoulos, Thomas Hagen, Hitoshi Sasaki, Hirotake Yamamori: Precision AC-DC Difference Measurement System Based on a Programmable Josephson Voltage Standard. IEEE T. Instrumentation and Measurement 60(7): 2439-2444 (2011)

Hitoshi Sasaki, Hirotake Yamamori, Takahiro Yamada, Hiroyuki Fujiki, Akira Shoji, Ilya Budovsky, K. Shimizume: Evaluation of Low-Frequency Characteristic of a Thermal Converter Using Programmable Josephson Voltage Standard. IEEE T. Instrumentation and Measurement 59(11): 2930-2935 (2010)

Takahiro Yamada, Yasushi Murayama, Hirotake Yamamori, Hitoshi Sasaki, Akira Shoji, Akio Iwasa, Hidefumi Nishinaka, Yasuhiro Nakamura: Comparison of a Multichip 10-V Programmable Josephson Voltage Standard System With a Superconductor-Insulator-Superconductor-Based Conventional System. IEEE T. Instrumentation and Measurement 58(4): 832-837 (2009)

Yonuk Chong, Charles J. Burroughs, Paul D. Dresselhaus, Nicolas Hadacek, Hirotake Yamamori, Samuel P. Benz: 2.6-V high-resolution programmable Josephson voltage standard circuits using double-stacked MoSi₂-barrier junctions. IEEE T. Instrumentation and Measurement 54(2): 616-619 (2005)

Mayumi Ishizaki, Hirotake Yamamori, Akira Shoji, Paul D. Dresselhaus, Samuel P. Benz: Programmable Josephson voltage standard circuits using arrays of NbN/TiN/NbN/TiN/NbN double-junction stacks operated at 10 K. IEEE T. Instrumentation and Measurement 54(2): 620-623 (2005)

Chiharu Urano, Yasushi Murayama, Akio Iwasa, Akira Shoji, Hirotake Yamamori, Mayumi Ishizaki: A precise evaluation of NbN-based 1-V programmable Josephson voltage standard arrays. IEEE T. Instrumentation and Measurement 54(2): 645-648 (2005)

Hitoshi Sasaki, Hirotake Yamamori, Hiroyuki Fujiki, Kunihiko Takahashi, Akira Shoji: Measurement of thermoelectric effects in a thermal converter using a NbN/TiN/NbN Josephson junction array. IEEE T. Instrumentation and Measurement 52(2): 359-362 (2003)