| 2007 | ||
|---|---|---|
| c2 | Tsuneo Nakanishi, Mitsunori Fujita, Susumu Yamazaki, Naohito Yamashita, Shuichi Ashihara: Tailoring the Domain Engineering Process of the PLUS Method. APSEC 2007: 486-493 | |
| 2004 | ||
| c1 | Tsuneo Nakanishi, Minoru Hatamoto, Michihiro Matsumoto, Susumu Yamazaki, Teruaki Kitasuka, Akira Fukuda: Product Line Based Component Unification and Exploiting Unified Components in FORM. APSEC 2004: 559-563 | |
| 1995 | ||
| j1 | Kiyoshi Furuya, Susumu Yamazaki, Masayuki Sato: Stuck-Open Fault Detectabilities of Various TPG Circuits for Use in Two-Pattern Testing. IEICE Transactions 78-D(7): 889-894 (1995) | |
| 1 | Shuichi Ashihara | |
| 2 | Mitsunori Fujita | |
| 3 | Akira Fukuda | |
| 4 | Kiyoshi Furuya | |
| 5 | Minoru Hatamoto | |
| 6 | Teruaki Kitasuka | |
| 7 | Michihiro Matsumoto | |
| 8 | Tsuneo Nakanishi | |
| 9 | Masayuki Sato | |
| 10 | Naohito Yamashita |
Colors in the list of coauthors
Last update Tue May 21 17:34:08 2013 CET by the DBLP Team —
Data released under the ODC-BY 1.0 license — See also our legal information page