DBLP: Masayoshi Yoshimura

	2012
c10		Shusuke Yoshimoto, Takuro Amashita, Masayoshi Yoshimura, Yusuke Matsunaga, Hiroto Yasuura, Shintaro Izumi, Hiroshi Kawaguchi, Masahiko Yoshimoto: Neutron-induced soft error rate estimation for SRAM using PHITS. IOLTS 2012: 138-141
c9		Krishna Chaitanya Nunna, Farhad Mehdipour, Masayoshi Yoshimura, Kazuaki Murakami: Methodology for early estimation of hierarchical routing resources in 3D FPGAs. VLSI-SoC 2012: 213-218
	2011
c8		Masayoshi Yoshimura, Yusuke Akamine, Yusuke Matsunaga: A Soft Error Tolerance Estimation Method for Sequential Circuits. DFT 2011: 268-276
c7		Shusuke Yoshimoto, Takuro Amashita, D. Kozuwa, Taiga Takata, Masayoshi Yoshimura, Yusuke Matsunaga, Hiroto Yasuura, Hiroshi Kawaguchi, Masahiko Yoshimoto: Multiple-bit-upset and single-bit-upset resilient 8T SRAM bitcell layout with divided wordline structure. IOLTS 2011: 151-156
	2010
c6		Masayoshi Yoshimura, Hiroshi Ogawa, Toshinori Hosokawa, Koji Yamazaki: Evaluation of transition untestable faults using a multi-cycle capture test generation method. DDECS 2010: 273-276
	2005
c5		Masayoshi Yoshimura: Implementation of Multiobjective Optimization Procedures at the Product Design Planning Stage. System Modelling and Optimization 2005: 181-191
	2004
c4		Atsushi Kitazawa, Masayoshi Yoshimura: SemanticObjects and Biomedical Informatics. BIBE 2004: 497-502
	2002
c3		Masayoshi Yoshimura, Toshinori Hosokawa, Mitsuyasu Ohta: A Test Point Insertion Method to Reduce the Number of Test Patterns. Asian Test Symposium 2002: 298-304
c2		Masayoshi Yoshimura: Collaborative optimization for product design and manufacturing. CAD 2002: 1-16
	2001
c1		Toshinori Hosokawa, Masayoshi Yoshimura, Mitsuyasu Ohta: Design for testability strategies using full/partial scan designs and test point insertions to reduce test application times. ASP-DAC 2001: 485-491

2012

c10

Shusuke Yoshimoto, Takuro Amashita, Masayoshi Yoshimura, Yusuke Matsunaga, Hiroto Yasuura, Shintaro Izumi, Hiroshi Kawaguchi, Masahiko Yoshimoto: Neutron-induced soft error rate estimation for SRAM using PHITS. IOLTS 2012: 138-141

Krishna Chaitanya Nunna, Farhad Mehdipour, Masayoshi Yoshimura, Kazuaki Murakami: Methodology for early estimation of hierarchical routing resources in 3D FPGAs. VLSI-SoC 2012: 213-218

2011

Masayoshi Yoshimura, Yusuke Akamine, Yusuke Matsunaga: A Soft Error Tolerance Estimation Method for Sequential Circuits. DFT 2011: 268-276

Shusuke Yoshimoto, Takuro Amashita, D. Kozuwa, Taiga Takata, Masayoshi Yoshimura, Yusuke Matsunaga, Hiroto Yasuura, Hiroshi Kawaguchi, Masahiko Yoshimoto: Multiple-bit-upset and single-bit-upset resilient 8T SRAM bitcell layout with divided wordline structure. IOLTS 2011: 151-156

2010

Masayoshi Yoshimura, Hiroshi Ogawa, Toshinori Hosokawa, Koji Yamazaki: Evaluation of transition untestable faults using a multi-cycle capture test generation method. DDECS 2010: 273-276

2005

Masayoshi Yoshimura: Implementation of Multiobjective Optimization Procedures at the Product Design Planning Stage. System Modelling and Optimization 2005: 181-191

2004

Atsushi Kitazawa, Masayoshi Yoshimura: SemanticObjects and Biomedical Informatics. BIBE 2004: 497-502

2002

Masayoshi Yoshimura, Toshinori Hosokawa, Mitsuyasu Ohta: A Test Point Insertion Method to Reduce the Number of Test Patterns. Asian Test Symposium 2002: 298-304

Masayoshi Yoshimura: Collaborative optimization for product design and manufacturing. CAD 2002: 1-16

2001

Toshinori Hosokawa, Masayoshi Yoshimura, Mitsuyasu Ohta: Design for testability strategies using full/partial scan designs and test point insertions to reduce test application times. ASP-DAC 2001: 485-491

1	Yusuke Akamine	[c8]
2	Takuro Amashita	[c10] [c7]
3	Toshinori Hosokawa	[c6] [c3] [c1]
4	Shintaro Izumi	[c10]
5	Hiroshi Kawaguchi	[c10] [c7]
6	Atsushi Kitazawa	[c4]
7	D. Kozuwa	[c7]
8	Yusuke Matsunaga	[c10] [c8] [c7]
9	Farhad Mehdipour	[c9]
10	Kazuaki Murakami	[c9]
11	Krishna Chaitanya Nunna	[c9]
12	Hiroshi Ogawa	[c6]
13	Mitsuyasu Ohta	[c3] [c1]
14	Taiga Takata	[c7]
15	Koji Yamazaki	[c6]
16	Hiroto Yasuura	[c10] [c7]
17	Masahiko Yoshimoto	[c10] [c7]
18	Shusuke Yoshimoto	[c10] [c7]

Masayoshi Yoshimura

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