Cadmus A. Yuan

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	2008
j3		Cadmus A. Yuan, Olaf van der Sluis, Willem D. van Driel, G. Q. (Kouchi) Zhang: The need for multi-scale approaches in Cu/low-k reliability issues. Microelectronics Reliability 48(6): 833-842 (2008)
	2007
j2		Cadmus A. Yuan, Olaf van der Sluis, G. Q. (Kouchi) Zhang, Leo J. Ernst, Willem D. van Driel, Richard B. R. van Silfhout: Molecular simulation on the material/interfacial strength of the low-dielectric materials. Microelectronics Reliability 47(9-11): 1483-1491 (2007)
j1		Willem D. van Driel, D. G. Yang, Cadmus A. Yuan, M. van Kleef, G. Q. (Kouchi) Zhang: Mechanical reliability challenges for MEMS packages: Capping. Microelectronics Reliability 47(9-11): 1823-1826 (2007)

Coauthor Index

1	Willem D. van Driel (W. D. van Driel)	[j3] [j2] [j1]
2	Leo J. Ernst (L. J. Ernst)	[j2]
3	M. van Kleef	[j1]
4	Richard B. R. van Silfhout	[j2]
5	Olaf van der Sluis	[j3] [j2]
6	D. G. Yang	[j1]
7	G. Q. Zhang (G. Q. (Kouchi) Zhang)	[j3] [j2] [j1]

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