Bin Zhang

Impact Technologies / Georgia Insititute of Technology / Nanyang Technological University

other persons with the same name:

• Bin Zhang
• Bin Zhang 0001 - Northeastern University
• Bin Zhang 0002 - Merck Research Labs, Departments of Human Genetics and Biostatistics, UCLA
• Bin Zhang 0003 - State Key Laboratory of Information Security, Institute of Software, Chinese Academy of Sciences / University of Luxembourg
• Bin Zhang 0004 - HP Labs Palo Alto
• Bin Zhang 0005 - Arkansas State University
• Bin Zhang 0006 - Lingnan College, Sun Yat-sen University / University of Science and Technology of China
• Bin Zhang 0007 - De Paul University
• Bin Zhang 0009 - University of Washington, Seattle, USA
• Bin Zhang 0010 - University of Southern California
• Bin Zhang 0011 - University of Texas at Austin
• Bin Zhang 0012 - East China University of Science and Technology
• Bin Zhang 0013 - IBM China Research Lab.
• Bin Zhang 0014 - Carnegie Mellon University / Lousiana State University
• Bin Zhang 0015 - Information Engineering University of PLA
• Bin Zhang 0016 - Network Research Center of Tsinghua University
• Bin Zhang 0017 - Harvard University
• Bin Zhang 0018 - Institut für Nachrichtentechnik, RWTH Aachen, Germany

	2012
j10		Chaochao Chen, Douglas Brown, Chris Sconyers, Bin Zhang, George J. Vachtsevanos, Marcos E. Orchard: An integrated architecture for fault diagnosis and failure prognosis of complex engineering systems. Expert Syst. Appl. 39(10): 9031-9040 (2012)
j9		Chaochao Chen, Bin Zhang, George J. Vachtsevanos: Prediction of Machine Health Condition Using Neuro-Fuzzy and Bayesian Algorithms. IEEE T. Instrumentation and Measurement 61(2): 297-306 (2012)
	2011
j8		Bin Zhang, Chris Sconyers, Carl S. Byington, Romano Patrick, Marcos E. Orchard, George J. Vachtsevanos: A Probabilistic Fault Detection Approach: Application to Bearing Fault Detection. IEEE Transactions on Industrial Electronics 58(5): 2011-2018 (2011)
j7		Chaochao Chen, Bin Zhang, George J. Vachtsevanos, Marcos E. Orchard: Machine Condition Prediction Based on Adaptive Neuro-Fuzzy and High-Order Particle Filtering. IEEE Transactions on Industrial Electronics 58(9): 4353-4364 (2011)
	2010
j6		Bin Zhang, Danwei Wang, Yongqiang Ye: On learning transient, auto-tunings of learnable bandwidth and lead step in iterative learning control. Int. J. Systems Science 41(4): 353-363 (2010)
	2009
j5		Keliang Zhou, Danwei Wang, Bin Zhang, Yigang Wang: Plug-In Dual-Mode-Structure Repetitive Controller for CVCF PWM Inverters. IEEE Transactions on Industrial Electronics 56(3): 784-791 (2009)
j4		Bin Zhang, Taimoor Khawaja, Romano Patrick, George J. Vachtsevanos, Marcos E. Orchard, Abhinav Saxena: Application of Blind Deconvolution Denoising in Failure Prognosis. IEEE T. Instrumentation and Measurement 58(2): 303-310 (2009)
	2008
j3		Bin Zhang, Danwei Wang, Keliang Zhou, Yigang Wang: Linear Phase Lead Compensation Repetitive Control of a CVCF PWM Inverter. IEEE Transactions on Industrial Electronics 55(4): 1595-1602 (2008)
c4		Bin Zhang, Danwei Wang, Yongqiang Ye, Yigang Wang, Keliang Zhou: Multirate iterative learning control schemes. ICARCV 2008: 769-774
	2007
j2		Keliang Zhou, Danwei Wang, Bin Zhang, Yigang Wang, J. A. Ferreira, S. W. H. de Haan: Dual-mode structure digital repetitive control. Automatica 43(3): 546-554 (2007)
	2006
c3		Bin Zhang, Danwei Wang, Yongqiang Ye, Yigang Wang: Tracking Accuracy Improvement by Sliding Phase-in Iterative Learning Control. ICARCV 2006: 1-6
	2005
j1		Bin Zhang, Danwei Wang, Yongqiang Ye: Wavelet transform-based frequency tuning ILC. IEEE Transactions on Systems, Man, and Cybernetics, Part B 35(1): 107-114 (2005)
	2004
c2		Bin Zhang, Danwei Wang, Yongqiang Ye: Experimental study of time-frequency based ILC. ICARCV 2004: 619-624
c1		Bin Zhang, Danwei Wang, Yongqiang Ye: On learning transient and cutoff frequency tuning in ILC. RAM 2004: 484-489

Coauthor Index

Colors in the list of coauthors

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