C. Y. Zhu

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	2012
j2		Arvydas Matulionis, Juozapas Liberis, Emilis Sermuksnis, L. Ardaravicius, A. Simukovic, C. Kayis, C. Y. Zhu, R. Ferreyra, Vitaliy Avrutin, Ümit Özgür, Hadis Morkoç: Window for better reliability of nitride heterostructure field effect transistors. Microelectronics Reliability 52(9-10): 2149-2152 (2012)
	2009
j1		C. Y. Zhu, C. C. Ling, G. Brauer, W. Anwand, W. Skorupa: Deep-level defects study of arsenic-implanted ZnO single crystal. Microelectronics Journal 40(2): 286-288 (2009)

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