Rene Zingg Coauthor index pubzone.org

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Sudha Gopalan, Benno H. Krabbenborg, Jan-Hein Egbers, Bart van Velzen, Rene Zingg: Reliability of power transistors against application driven temperature swings. Microelectronics Reliability 42(9-11): 1623-1628 (2002)

Coauthor Index

1Jan-Hein Egbers
[j1]
2Sudha Gopalan
[j1]
3Benno H. Krabbenborg
[j1]
4Bart van Velzen
[j1]
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