| 2002 | ||
|---|---|---|
| j1 | Sudha Gopalan, Benno H. Krabbenborg, Jan-Hein Egbers, Bart van Velzen, Rene Zingg: Reliability of power transistors against application driven temperature swings. Microelectronics Reliability 42(9-11): 1623-1628 (2002) | |
| 1 | Jan-Hein Egbers | |
| 2 | Sudha Gopalan | |
| 3 | Benno H. Krabbenborg | |
| 4 | Bart van Velzen |
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